LEO Series 4K Line Scan Camera Special optical lenses for Wafer appearance inspection Identification and inspection of the

Identification and inspection of the large size mechanical parts

542XH-178-71M(LM)

stable data transmission in high-speed production environments

1920x1080(16:9)、1440x1080(4:3) 4608x2592(16:9)、4608x3456(4:3)

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LEO Series 4K Line Scan Camera Special optical lenses for Wafer appearance inspection Identification and inspection of theFeatures Support WindowsLinux Up to 128 MB local memory for burst transmission and retransmission Adopts GigE interface and max. transmission distance of 100 meters without relay Compatible with GigE Vision Protocol, GenlCam Standard, and the third party software based on these protocol and standard Pack List 1*camera 1*cable